High-accuracy thermal conductivity analyzer for solids, thin films, polymers, and metals per ASTM D5470

High-performance thermal conductivity analyzer designed in accordance with ASTM D5470. The system provides highly accurate and repeatable measurements by minimizing external thermal influences, optimizing sample positioning, and maintaining stable temperature control during testing.

The TCM-100GV operates within a thermal conductivity range of 0.1–80 W/m*K with samples 0.01–10 mm thick (circular samples Φ 25 mm, square samples available as an option).
The integrated Peltier system does not require external circulators; furthermore, the system is equipped with dual environmental shielding, pressure monitoring, and automatic adjustment of the distance from the sample to ensure stable measurement conditions.

It is ideal for analyzing thermal interface materials (TIMs—such as thermal pastes, gap fillers, pads, and thermally conductive adhesives), allowing for the evaluation of their effectiveness in heat dissipation between coupled surfaces, thin films, and sheets, including polymer films, functional membranes, metal sheets, and laminated materials, for which heat management is a critical parameter in electronic and industrial applications.

It is also suitable for characterizing polymers and composite materials, enabling the study of how formulations, additives, and thermally conductive fillers influence a material’s thermal performance, and supporting research and development, quality control, and product optimization. It is also suitable for metals and materials with high thermal conductivity, allowing for the accurate determination of the thermal properties of metal alloys, graphite, carbon-based materials, and other conductive materials used in heat sinks, heat exchangers, and electronic components.

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